Characterization of the thermoresponsive shape-memory effect in polyether ether ketone (PEEK)

• المؤلفون الرئيسيون: Wu, Xue Lian, Huang, Wei Min, Ding, Zhen, Tan, Hui Xin, Yang, Wen Guang, Sun, Ke Yuan
• مؤلفون آخرون: School of Mechanical and Aerospace Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2014
• الموضوعات: DRNTU::Engineering::Aeronautical engineering
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/102723; http://hdl.handle.net/10220/19061

We conducted a systematic experimental investigation to characterize the shape-memory effect in a commercial poly(ether ether ketone) (PEEK), which is a very important high-temperature polymers at present. The focus was on the influence of the programming conditions and heating temperature for recovery on the shape-recovery ratio (Rr). We concluded that PEEK is not only an important engineering polymer as it is traditionally known but is also an excellent high-temperature shape-memory polymer. For a residual programming strain of 30%, the maximum Rr was about 90%. It was revealed that it was practically feasible to program PEEK at room temperature and to lower the recovery temperature from its melting temperature range to around its glass-transition temperature.