Rapid light output degradation of GaN-based packaged LED in the early stage of humidity test

An initial sharp decrease in the light output of a high-power light-emitting diode is observed when it is exposed to humid condition. TGA and energy-dispersive system analyses confirm the possibility of moisture entrapment in the silicone encapsulation; moreover, the light scattering model verifies...

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Main Authors:	Chen, B. K., Li, X., Tan, Cher Ming, Chen, Sihan Joseph
Other Authors:	School of Electrical and Electronic Engineering
Format:	Article
Language:	English
Published:	2013
Subjects:	DRNTU::Engineering::Electrical and electronic engineering
Online Access:	https://hdl.handle.net/10356/102789 http://hdl.handle.net/10220/16477
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Institution:	Nanyang Technological University
Language:	English

id	sg-ntu-dr.10356-102789
record_format	dspace
spelling	sg-ntu-dr.10356-1027892020-03-07T14:00:35Z Rapid light output degradation of GaN-based packaged LED in the early stage of humidity test Chen, B. K. Li, X. Tan, Cher Ming Chen, Sihan Joseph School of Electrical and Electronic Engineering A*STAR SIMTech DRNTU::Engineering::Electrical and electronic engineering An initial sharp decrease in the light output of a high-power light-emitting diode is observed when it is exposed to humid condition. TGA and energy-dispersive system analyses confirm the possibility of moisture entrapment in the silicone encapsulation; moreover, the light scattering model verifies qualitatively the scattering of the light due to the entrapped moisture, and it is this scattering that renders an initial sharp drop in the light output. The finding shows the importance of pore size of the silicone gel in order to prevent such sharp decrease in the light output under a humid environment. 2013-10-14T06:18:34Z 2019-12-06T21:00:13Z 2013-10-14T06:18:34Z 2019-12-06T21:00:13Z 2011 2011 Journal Article Tan, C. M., Chen, B. K., Li, X., & Chen, S. J. (2011). Rapid Light Output Degradation of GaN-Based Packaged LED in the Early Stage of Humidity Test. IEEE Transactions on Device and Materials Reliability, 12(1), 44-48. https://hdl.handle.net/10356/102789 http://hdl.handle.net/10220/16477 10.1109/TDMR.2011.2173346 en IEEE transactions on device and materials reliability
institution	Nanyang Technological University
building	NTU Library
country	Singapore
collection	DR-NTU
language	English
topic	DRNTU::Engineering::Electrical and electronic engineering
spellingShingle	DRNTU::Engineering::Electrical and electronic engineering Chen, B. K. Li, X. Tan, Cher Ming Chen, Sihan Joseph Rapid light output degradation of GaN-based packaged LED in the early stage of humidity test
description	An initial sharp decrease in the light output of a high-power light-emitting diode is observed when it is exposed to humid condition. TGA and energy-dispersive system analyses confirm the possibility of moisture entrapment in the silicone encapsulation; moreover, the light scattering model verifies qualitatively the scattering of the light due to the entrapped moisture, and it is this scattering that renders an initial sharp drop in the light output. The finding shows the importance of pore size of the silicone gel in order to prevent such sharp decrease in the light output under a humid environment.
author2	School of Electrical and Electronic Engineering
author_facet	School of Electrical and Electronic Engineering Chen, B. K. Li, X. Tan, Cher Ming Chen, Sihan Joseph
format	Article
author	Chen, B. K. Li, X. Tan, Cher Ming Chen, Sihan Joseph
author_sort	Chen, B. K.
title	Rapid light output degradation of GaN-based packaged LED in the early stage of humidity test
title_short	Rapid light output degradation of GaN-based packaged LED in the early stage of humidity test
title_full	Rapid light output degradation of GaN-based packaged LED in the early stage of humidity test
title_fullStr	Rapid light output degradation of GaN-based packaged LED in the early stage of humidity test
title_full_unstemmed	Rapid light output degradation of GaN-based packaged LED in the early stage of humidity test
title_sort	rapid light output degradation of gan-based packaged led in the early stage of humidity test
publishDate	2013
url	https://hdl.handle.net/10356/102789 http://hdl.handle.net/10220/16477
_version_	1681045842508644352

Rapid light output degradation of GaN-based packaged LED in the early stage of humidity test

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