Conduction mechanisms on high retention annealed mgo-based resistive switching memory devices
We report on the conduction mechanisms of novel Ru/MgO/Cu and Ru/MgO/Ta resistive switching memory (RSM) devices. Current-voltage (I–V) measurements revealed Schottky emission (SE) as the dominant conduction mechanism in the high resistance state (HRS), which was validated by varying temperatures an...
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Main Authors: | , , , , |
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格式: | Article |
語言: | English |
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2019
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在線閱讀: | https://hdl.handle.net/10356/103404 http://hdl.handle.net/10220/47306 |
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機構: | Nanyang Technological University |
語言: | English |