Conduction mechanisms on high retention annealed mgo-based resistive switching memory devices

We report on the conduction mechanisms of novel Ru/MgO/Cu and Ru/MgO/Ta resistive switching memory (RSM) devices. Current-voltage (I–V) measurements revealed Schottky emission (SE) as the dominant conduction mechanism in the high resistance state (HRS), which was validated by varying temperatures an...

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Main Authors: Loy, Desmond Jia Jun, Dananjaya, Putu Andhita, Hong, Xiao Liang, Shum, D. P., Lew, Wensiang
其他作者: School of Physical and Mathematical Sciences
格式: Article
語言:English
出版: 2019
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在線閱讀:https://hdl.handle.net/10356/103404
http://hdl.handle.net/10220/47306
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機構: Nanyang Technological University
語言: English