Infrared metrology using visible light
Infrared (IR) spectroscopy and imaging are important tools in metrology, including material analysis, sensing and characterization. Although conventional methods of IR metrology are available, they face challenges related to the high cost and low efficiency of IR light sources and photodetectors. Th...
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主要作者: | Paterova, Anna |
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其他作者: | Soci Cesare |
格式: | Theses and Dissertations |
語言: | English |
出版: |
2019
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在線閱讀: | https://hdl.handle.net/10356/103485 http://hdl.handle.net/10220/47387 |
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