In-line digital holography for dynamic metrology of MEMS

In-line digital holography helps to relax the spatial resolution requirement on charge-coupled device sensors for digital recording of holograms and to utilize the full sensing area for image reconstruction which provides larger field of view and better imaging resolution. In this letter, a lensless...

Full description

Saved in:
Bibliographic Details
Main Authors: Singh, Vijay Raj, Anand, Asundi
Other Authors: School of Mechanical and Aerospace Engineering
Format: Article
Language:English
Published: 2011
Subjects:
Online Access:https://hdl.handle.net/10356/93818
http://hdl.handle.net/10220/6758
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Nanyang Technological University
Language: English