Interferometric dynamic measurement : techniques based on high-speed imaging or a single photodetector
In recent years, optical interferometry-based techniques have been widely used to perform noncontact measurement of dynamic deformation in different industrial areas. In these applications, various physical quantities need to be measured in any instant and the Nyquist sampling theorem has to be sati...
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Main Authors: | , , |
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Other Authors: | |
Format: | Article |
Language: | English |
Published: |
2014
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/103902 http://hdl.handle.net/10220/20030 |
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Institution: | Nanyang Technological University |
Language: | English |
Summary: | In recent years, optical interferometry-based techniques have been widely used to perform noncontact measurement of dynamic deformation in different industrial areas. In these applications, various physical quantities need to be measured in any instant and the Nyquist sampling theorem has to be satisfied along the time axis on each measurement point. Two types of techniques were developed for such measurements: one is based on high-speed cameras and the other uses a single photodetector. The limitation of the measurement range along the time axis in camera-based technology is mainly due to the low capturing rate, while the photodetector-based technology can only do the measurement on a single point. In this paper, several aspects of these two technologies are discussed. For the camera-based interferometry, the discussion includes the introduction of the carrier, the processing of the recorded images, the phase extraction algorithms in various domains, and how to increase the temporal measurement range by using multiwavelength techniques. For the detector-based interferometry, the discussion mainly focuses on the single-point and multipoint laser Doppler vibrometers and their applications for measurement under extreme conditions. The results show the effort done by researchers for the improvement of the measurement capabilities using interferometry-based techniques to cover the requirements needed for the industrial applications. |
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