A new approach to a practical subwavelength resolving microscope
Superresolution depends on near-field capture and transfer of high spatial frequencies from the scattering object. These evanescent waves are transferred to a near-field image domain using a negative index material. Measuring images with subwavelength scale resolution in the near field by scanning i...
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Main Authors: | Fiddy, Michael A., Chuang, Yi-Chen, Dudley, Richard |
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Other Authors: | School of Electrical and Electronic Engineering |
Format: | Article |
Language: | English |
Published: |
2013
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/104226 http://hdl.handle.net/10220/16980 |
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Institution: | Nanyang Technological University |
Language: | English |
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