A new approach to a practical subwavelength resolving microscope

Superresolution depends on near-field capture and transfer of high spatial frequencies from the scattering object. These evanescent waves are transferred to a near-field image domain using a negative index material. Measuring images with subwavelength scale resolution in the near field by scanning i...

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Main Authors: Fiddy, Michael A., Chuang, Yi-Chen, Dudley, Richard
其他作者: School of Electrical and Electronic Engineering
格式: Article
語言:English
出版: 2013
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在線閱讀:https://hdl.handle.net/10356/104226
http://hdl.handle.net/10220/16980
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機構: Nanyang Technological University
語言: English

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