A new approach to a practical subwavelength resolving microscope
Superresolution depends on near-field capture and transfer of high spatial frequencies from the scattering object. These evanescent waves are transferred to a near-field image domain using a negative index material. Measuring images with subwavelength scale resolution in the near field by scanning i...
Saved in:
Main Authors: | Fiddy, Michael A., Chuang, Yi-Chen, Dudley, Richard |
---|---|
其他作者: | School of Electrical and Electronic Engineering |
格式: | Article |
語言: | English |
出版: |
2013
|
主題: | |
在線閱讀: | https://hdl.handle.net/10356/104226 http://hdl.handle.net/10220/16980 |
標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|
相似書籍
-
Subwavelength superfocusing with a dipole-wave-reciprocal binary zone plate
由: Wang, Jun, et al.
出版: (2013) -
Study of scattering patterns and subwavelength scale imaging based on finite-sized metamaterials
由: Schenk, John O., et al.
出版: (2013) -
Study of scattering patterns and subwavelength scale imaging based on finite-sized metamaterials
由: Schenk, John O., et al.
出版: (2012) -
Optimal arrangement of meta-atoms composing metamaterials
由: Fiddy, Michael A., et al.
出版: (2012) -
A new DOA estimation approach using Volterra signal model
由: Wen, Fuxi, et al.
出版: (2013)