XPS quantification of the hetero-junction interface energy

• Main Authors: Ma, Zengsheng, Wang, Yan, Huang, Yongli, Zhou, Zhaofeng, Zhou, Yichun, Zheng, Weitao, Sun, Changqing
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/104825; http://hdl.handle.net/10220/16566
• Institution: Nanyang Technological University

We present an approach for quantifying the heterogeneous interface bond energy using X-ray photoelectron spectroscopy (XPS). Firstly, from analyzing the XPS core-level shift of the elemental surfaces we obtained the energy levels of an isolated atom and their bulk shifts of the constituent elements...