Defect levels in SnS thin films prepared using chemical spray pyrolysis

• Main Authors: Kartha, C. Sudha., Vijayakumar, K. P., Rao, M., Sajeesh, T. H., Jinesh, K. B.
• Other Authors: Energy Research Institute @ NTU (ERI@N)
• Format: Article
• Language: English
• Published: 2013
• Subjects: DRNTU::Science::Chemistry::Physical chemistry
• Online Access: https://hdl.handle.net/10356/105008; http://hdl.handle.net/10220/17063
• Institution: Nanyang Technological University

The origin of various defect levels in the SnS thin films deposited using chemical spray pyrolysis (CSP) technique has been explored in this manuscript, by employing low-temperature photoluminescence (PL) technique. Concentration of Sn in the samples was varied purposefully by ex situ diffusion in o...