Hardware Trojan detection with linear regression based gate-level characterization

• Main Authors: Zhang, Li, Chang, Chip-Hong
• 其他作者: School of Electrical and Electronic Engineering
• 格式: Conference or Workshop Item
• 語言: English
• 出版: 2015
• 主題: DRNTU::Engineering::Electrical and electronic engineering::Computer hardware, software and systems
• 在線閱讀: https://hdl.handle.net/10356/105038; http://hdl.handle.net/10220/25169; http://dx.doi.org/10.1109/APCCAS.2014.7032768
• 機構: Nanyang Technological University

Due to outsourcing of IC fabrication, chip supply contamination is a clear and present danger, of which hardware Trojans (HTs) pose the greatest threat. This paper reviews the limitation of existing gate level characterization approaches to HT detection and presents a new detection method with a fas...