An empirical approach to develop near-field limit for radiated-emission compliance check

• Main Authors: See, Kye Yak, Fang, Ning, Wang, Lin-Biao, Soh, Weishan, Svimonishvili, Tengiz, Oswal, Manish, Chang, Weng-Yew, Koh, Wee-Jin
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2014
• Subjects: DRNTU::Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/105192; http://hdl.handle.net/10220/20656; http://dx.doi.org/10.1109/TEMC.2014.2302003
• Institution: Nanyang Technological University

Based on measurements from a near-field scanner and far-field measurements obtained in a semi-anechoic chamber, a statistical relationship is established between a magnetic field in the near field and an electric field in the far field. The relationship makes it possible to transform a radiated-emission regulatory limit from the far-field to the near-field zone. The transformed near-field limit can allow efficient prediction of radiated-emission compliance for high-speed printed circuit boards. The presented results demonstrate the feasibility of the proposed method for a quick radiated-emission precompliance check without heavy equipment investment.