Phase retrieval for high-speed 3D measurement using binary patterns with projector defocusing

Recent digital technology allows binary patterns to be projected with a very high speed, which shows great potential for high-speed 3D measurement. However, how to retrieve an accurate phase with an even faster speed is still challenging. In this paper, an accurate and efficient phase retrieval tech...

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Bibliographic Details
Main Authors: Zheng, Dongliang, Kemao, Qian, Da, Feipeng, Seah, Hock Soon
Other Authors: Lehmann, Peter
Format: Article
Language:English
Published: 2019
Subjects:
Online Access:https://hdl.handle.net/10356/106379
http://hdl.handle.net/10220/49601
http://dx.doi.org/10.1117/12.2270064
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Institution: Nanyang Technological University
Language: English