Phase retrieval for high-speed 3D measurement using binary patterns with projector defocusing
Recent digital technology allows binary patterns to be projected with a very high speed, which shows great potential for high-speed 3D measurement. However, how to retrieve an accurate phase with an even faster speed is still challenging. In this paper, an accurate and efficient phase retrieval tech...
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Main Authors: | , , , |
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Other Authors: | |
Format: | Article |
Language: | English |
Published: |
2019
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/106379 http://hdl.handle.net/10220/49601 http://dx.doi.org/10.1117/12.2270064 |
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Institution: | Nanyang Technological University |
Language: | English |