Phase retrieval for high-speed 3D measurement using binary patterns with projector defocusing
Recent digital technology allows binary patterns to be projected with a very high speed, which shows great potential for high-speed 3D measurement. However, how to retrieve an accurate phase with an even faster speed is still challenging. In this paper, an accurate and efficient phase retrieval tech...
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| Main Authors: | , , , |
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| 格式: | Article |
| 語言: | English |
| 出版: |
2019
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| 主題: | |
| 在線閱讀: | https://hdl.handle.net/10356/106379 http://hdl.handle.net/10220/49601 http://dx.doi.org/10.1117/12.2270064 |
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