Structural damage identification with admittance signatures of smart PZT transducers
The concepts of vibration-based methods are integrated with the e/m impedance method to extend its applicability for damage location identification and damage growth characterization. Also, Bayesian network model is integrated to e/m impedance-based structural health monitoring.
Saved in:
Main Author: | |
---|---|
Other Authors: | |
Format: | Theses and Dissertations |
Language: | English |
Published: |
2008
|
Subjects: | |
Online Access: | http://hdl.handle.net/10356/12045 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Language: | English |
id |
sg-ntu-dr.10356-12045 |
---|---|
record_format |
dspace |
spelling |
sg-ntu-dr.10356-120452023-03-03T19:25:06Z Structural damage identification with admittance signatures of smart PZT transducers Akshay Surendra Kumar Naidu Soh, Chee Kiong School of Civil and Environmental Engineering DRNTU::Engineering::Civil engineering::Structures and design The concepts of vibration-based methods are integrated with the e/m impedance method to extend its applicability for damage location identification and damage growth characterization. Also, Bayesian network model is integrated to e/m impedance-based structural health monitoring. Doctor of Philosophy (CEE) 2008-09-25T06:35:45Z 2008-09-25T06:35:45Z 2004 2004 Thesis http://hdl.handle.net/10356/12045 en Nanyang Technological University 249 p. application/pdf |
institution |
Nanyang Technological University |
building |
NTU Library |
continent |
Asia |
country |
Singapore Singapore |
content_provider |
NTU Library |
collection |
DR-NTU |
language |
English |
topic |
DRNTU::Engineering::Civil engineering::Structures and design |
spellingShingle |
DRNTU::Engineering::Civil engineering::Structures and design Akshay Surendra Kumar Naidu Structural damage identification with admittance signatures of smart PZT transducers |
description |
The concepts of vibration-based methods are integrated with the e/m impedance method to extend its applicability for damage location identification and damage growth characterization. Also, Bayesian network model is integrated to e/m impedance-based structural health monitoring. |
author2 |
Soh, Chee Kiong |
author_facet |
Soh, Chee Kiong Akshay Surendra Kumar Naidu |
format |
Theses and Dissertations |
author |
Akshay Surendra Kumar Naidu |
author_sort |
Akshay Surendra Kumar Naidu |
title |
Structural damage identification with admittance signatures of smart PZT transducers |
title_short |
Structural damage identification with admittance signatures of smart PZT transducers |
title_full |
Structural damage identification with admittance signatures of smart PZT transducers |
title_fullStr |
Structural damage identification with admittance signatures of smart PZT transducers |
title_full_unstemmed |
Structural damage identification with admittance signatures of smart PZT transducers |
title_sort |
structural damage identification with admittance signatures of smart pzt transducers |
publishDate |
2008 |
url |
http://hdl.handle.net/10356/12045 |
_version_ |
1759856150017212416 |