Structural damage identification with admittance signatures of smart PZT transducers

• المؤلف الرئيسي: Akshay Surendra Kumar Naidu
• مؤلفون آخرون: Soh, Chee Kiong
• التنسيق: Theses and Dissertations
• اللغة: English
• منشور في: 2008
• الموضوعات: DRNTU::Engineering::Civil engineering::Structures and design
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/12045
• المؤسسة: Nanyang Technological University

The concepts of vibration-based methods are integrated with the e/m impedance method to extend its applicability for damage location identification and damage growth characterization. Also, Bayesian network model is integrated to e/m impedance-based structural health monitoring.