Structural damage identification with admittance signatures of smart PZT transducers

The concepts of vibration-based methods are integrated with the e/m impedance method to extend its applicability for damage location identification and damage growth characterization. Also, Bayesian network model is integrated to e/m impedance-based structural health monitoring.

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書目詳細資料
主要作者: Akshay Surendra Kumar Naidu
其他作者: Soh, Chee Kiong
格式: Theses and Dissertations
語言:English
出版: 2008
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在線閱讀:http://hdl.handle.net/10356/12045
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機構: Nanyang Technological University
語言: English