Economic optimization of test operations for PCB assembly
A variety of test operations are used in PCB assembly to ensure the quality and hold down the cost of product service, e.g. component test, in-circuit test, function test and system test. However, the process flow and procedure of test operations are influenced by many factors occurred at the time o...
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sg-ntu-dr.10356-132662023-07-04T16:02:19Z Economic optimization of test operations for PCB assembly Xu, Jingyi. Chin, Edward Hsi Ling School of Electrical and Electronic Engineering DRNTU::Engineering::Industrial engineering::Engineering management A variety of test operations are used in PCB assembly to ensure the quality and hold down the cost of product service, e.g. component test, in-circuit test, function test and system test. However, the process flow and procedure of test operations are influenced by many factors occurred at the time of assembly and they are often dynamic rather than static through the whole assembly life of the product. Hence, the best way to optimize the cost, quality and throughput of a testing process is to dynamically analyze the testing process and adjust testing strategy accordingly. Master of Science (Consumer Electronics) 2008-08-20T03:05:01Z 2008-10-20T07:22:18Z 2008-08-20T03:05:01Z 2008-10-20T07:22:18Z 1999 1999 Thesis http://hdl.handle.net/10356/13266 en 110 p. application/pdf |
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DRNTU::Engineering::Industrial engineering::Engineering management Xu, Jingyi. Economic optimization of test operations for PCB assembly |
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A variety of test operations are used in PCB assembly to ensure the quality and hold down the cost of product service, e.g. component test, in-circuit test, function test and system test. However, the process flow and procedure of test operations are influenced by many factors occurred at the time of assembly and they are often dynamic rather than static through the whole assembly life of the product. Hence, the best way to optimize the cost, quality and throughput of a testing process is to dynamically analyze the testing process and adjust testing strategy accordingly. |
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Chin, Edward Hsi Ling |
author_facet |
Chin, Edward Hsi Ling Xu, Jingyi. |
format |
Theses and Dissertations |
author |
Xu, Jingyi. |
author_sort |
Xu, Jingyi. |
title |
Economic optimization of test operations for PCB assembly |
title_short |
Economic optimization of test operations for PCB assembly |
title_full |
Economic optimization of test operations for PCB assembly |
title_fullStr |
Economic optimization of test operations for PCB assembly |
title_full_unstemmed |
Economic optimization of test operations for PCB assembly |
title_sort |
economic optimization of test operations for pcb assembly |
publishDate |
2008 |
url |
http://hdl.handle.net/10356/13266 |
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1772826758684344320 |