Ng, S. W., & Yi, S. (2008). A finite element study of stresses developed in plastic encapsulated electronic packages during leadframe pull-out testing.
Chicago Style CitationNg, Shioo Wat., and Sung Yi. A Finite Element Study of Stresses Developed in Plastic Encapsulated Electronic Packages During Leadframe Pull-out Testing. 2008.
MLA CitationNg, Shioo Wat., and Sung Yi. A Finite Element Study of Stresses Developed in Plastic Encapsulated Electronic Packages During Leadframe Pull-out Testing. 2008.
Warning: These citations may not always be 100% accurate.