Analysis of circuit aging on accuracy degradation of deep neural network accelerator

• Main Authors: Liu, Wenye, Chang, Chip-Hong
• Other Authors: School of Electrical and Electronic Engineering
• Format: Conference or Workshop Item
• Language: English
• Published: 2020
• Subjects: Engineering::Electrical and electronic engineering::Integrated circuits; Deep Neural Network; Circuit Aging
• Online Access: https://hdl.handle.net/10356/136843
• Institution: Nanyang Technological University

Deep neural networks have achieved phenomenal successes in vision recognition tasks, which motivate the deployment of deep learning in portable and smart wearable devices. To overcome the fundamental challenges of power and resource limitation, application-specific integrated circuit accelerators ha...