Analysis of circuit aging on accuracy degradation of deep neural network accelerator

• المؤلفون الرئيسيون: Liu, Wenye, Chang, Chip-Hong
• مؤلفون آخرون: School of Electrical and Electronic Engineering
• التنسيق: Conference or Workshop Item
• اللغة: English
• منشور في: 2020
• الموضوعات: Engineering::Electrical and electronic engineering::Integrated circuits; Deep Neural Network; Circuit Aging
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/136843
• المؤسسة: Nanyang Technological University

Deep neural networks have achieved phenomenal successes in vision recognition tasks, which motivate the deployment of deep learning in portable and smart wearable devices. To overcome the fundamental challenges of power and resource limitation, application-specific integrated circuit accelerators ha...