Analysis of circuit aging on accuracy degradation of deep neural network accelerator

• Main Authors: Liu, Wenye, Chang, Chip-Hong
• 其他作者: School of Electrical and Electronic Engineering
• 格式: Conference or Workshop Item
• 語言: English
• 出版: 2020
• 主題: Engineering::Electrical and electronic engineering::Integrated circuits; Deep Neural Network; Circuit Aging
• 在線閱讀: https://hdl.handle.net/10356/136843

Deep neural networks have achieved phenomenal successes in vision recognition tasks, which motivate the deployment of deep learning in portable and smart wearable devices. To overcome the fundamental challenges of power and resource limitation, application-specific integrated circuit accelerators ha...