Detecting adversarial samples for deep neural networks through mutation testing

• المؤلف الرئيسي: Tan, Kye Yen
• مؤلفون آخرون: Chang Chip Hong
• التنسيق: Final Year Project
• اللغة: English
• منشور في: Nanyang Technological University 2020
• الموضوعات: Engineering::Computer science and engineering::Computing methodologies::Artificial intelligence; Engineering::Electrical and electronic engineering
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/138719
• المؤسسة: Nanyang Technological University

Deep Neural Networks (DNNs) are adept at many tasks, with the more well-known task of image recognition using a subset of DNNs called Convolutional Neural Networks (CNNs). However, they are prone to attacks called adversarial attacks. Adversarial attacks are malicious modifications made on input sam...