Detecting adversarial samples for deep neural networks through mutation testing

• 主要作者: Tan, Kye Yen
• 其他作者: Chang Chip Hong
• 格式: Final Year Project
• 語言: English
• 出版: Nanyang Technological University 2020
• 主題: Engineering::Computer science and engineering::Computing methodologies::Artificial intelligence; Engineering::Electrical and electronic engineering
• 在線閱讀: https://hdl.handle.net/10356/138719
• 機構: Nanyang Technological University

Deep Neural Networks (DNNs) are adept at many tasks, with the more well-known task of image recognition using a subset of DNNs called Convolutional Neural Networks (CNNs). However, they are prone to attacks called adversarial attacks. Adversarial attacks are malicious modifications made on input sam...