Atomic structure of grain boundaries for layered molybdenum disulfide (MoS2)
A study on the atomic structure characterization of grain boundary for monolayered molybdenum disulphide (MoS2) by using aberration-corrected scanning transmission electron microscope (STEM) techniques. The MoS2-MoSe2 heterostructure thin film on silicon wafer are firstly grown by chemical vapour de...
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| 格式: | Final Year Project |
| 語言: | English |
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Nanyang Technological University
2020
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| 在線閱讀: | https://hdl.handle.net/10356/138860 |
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| 機構: | Nanyang Technological University |
| 語言: | English |