Spectroscopic nanoimaging of all-semiconductor plasmonic gratings using photoinduced force and scattering type nanoscopy

• Main Authors: Huang, Yi, Legrand, David, Vincent, Rémi, Foli, Ekoué Athos Dogbe, Nowak, Derek, Lerondel, Gilles, Bachelot, Renaud, Taliercio, Thierry, Barho, Franziska, Cerutti, Laurent, Gonzalez-Posada, Fernando, Tay, Beng Kang, Bruyant, Aurelien
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2020
• Subjects: Engineering::Electrical and electronic engineering; Nanospectroscopy; Highly Doped Semiconductors
• Online Access: https://hdl.handle.net/10356/139345
• Institution: Nanyang Technological University

All-semiconductor plasmonic gratings are investigated by spectroscopic nanoimaging in the vicinity of the plasma frequency, where the material behaves as an epsilon near-zero (ENZ) material. Both phase-sensitive scattering type nanoscopy (s-SNOM) and photoinduced force microscopy (PiFM) are carried...