Voltage transient analysis as a generic tool for solar junction characterization

• Main Authors: Prakoso, Ari Bimo, Lu, Chenjin, Rusli, Cortecchia, Daniele, Soci, Cesare, Berthe, Maxime, Deresmes, Dominique, Ayachi, Boubakeur, Vilcot, Jean-Pierre, Diesinger, Heinrich
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2020
• Subjects: Engineering::Electrical and electronic engineering; Voltage Transient; Perovskite Solar Cell
• Online Access: https://hdl.handle.net/10356/139403
• Institution: Nanyang Technological University

Surface photovoltage transients on solar junctions have often been associated with carrier lifetime in the literature. However, the carrier decay in a junction is not governed by a first order carrier decay, but resulting from a differential capacitance interacting with a differential conductivity....