Off-feature information incorporated metric learning for face recognition

• Main Authors: Huang, Renjie, Jiang, Xudong
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2020
• Subjects: Engineering::Electrical and electronic engineering; Face Recognition; Metric Learning
• Online Access: https://hdl.handle.net/10356/142570
• Institution: Nanyang Technological University

Distance metric learning suppresses the intraclass variation while preserving the inter-class variation between two feature vectors. However, these two types of information are mixed in the feature vectors that need to be separated based on learning from the training data. The limited training data...