Photonic integrated circuit testbench

• المؤلف الرئيسي: Mei, Ting.
• مؤلفون آخرون: School of Electrical and Electronic Engineering
• التنسيق: Research Report
• اللغة: English
• منشور في: 2008
• الموضوعات: DRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/14512
• المؤسسة: Nanyang Technological University

In this project, we set up a test bed for photonic integrated circuits. The system can be used to measure several primary properties of photonic integrated circuit, such as I-V, L-I, optical spectrum, optical gain or loss and polarization dependence. The system can provide the electric bias for t...