A 1036-F2/bit high reliability temperature compensated cross-coupled comparator-based PUF

In this article, a compact physical unclonable function (PUF) based on cross-coupled comparator is presented. Featuring a positive feedback response generation mechanism, the mismatch in analog signals between the cross-coupled transistor pair is quickly amplified to prevent its polarity from flippi...

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Main Authors: Zhao, Qiang, Wu, Yiheng, Zhao, Xiaojin, Cao, Yuan, Chang, Chip-Hong
Other Authors: School of Electrical and Electronic Engineering
Format: Article
Language:English
Published: 2021
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Online Access:https://hdl.handle.net/10356/145827
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spelling sg-ntu-dr.10356-1458272021-01-11T05:21:28Z A 1036-F2/bit high reliability temperature compensated cross-coupled comparator-based PUF Zhao, Qiang Wu, Yiheng Zhao, Xiaojin Cao, Yuan Chang, Chip-Hong School of Electrical and Electronic Engineering Centre for Integrated Circuits and Systems Engineering::Electrical and electronic engineering Physical Unclonable Function Cross-coupled Comparator In this article, a compact physical unclonable function (PUF) based on cross-coupled comparator is presented. Featuring a positive feedback response generation mechanism, the mismatch in analog signals between the cross-coupled transistor pair is quickly amplified to prevent its polarity from flipping by the temporal noise. The rapid enlargement of noise margin by the sense amplifier also contributes to stabilizing the response against supply voltage variations. To improve its temperature stability, the counteracting effect of complementary-to-absolute temperature (CTAT) and proportional-to-absolute-temperature (PTAT) drives are considered in sizing the bit cell transistors. The proposed design is fabricated in a standard 65-nm CMOS process. The bit cell occupies an area of only 4.38 µm2 (i.e., 1036 F2), and the overall PUF chip consumes 2.98 pJ/bit at the throughput of 8 Mb/s, of which only 1.61 pJ/bit is due to the PUF’s core. With the uniqueness measured to be 49.53%, the unpredictability of the fabricated PUF chips is validated by autocorrelation function and NIST randomness tests. Compared with the state-of-the-art implementations, the proposed PUF has the lowest native response instability of 1.46% with 500 repeated PUF readouts at 27 ◦C and 1.2 V. By varying the operating temperature from −50 ◦C to 150 ◦C in a step size of 10 ◦C and the supply voltage from 1.0 to 1.4 V in a step size of 0.1 V simultaneously, the average reliability of the proposed PUF obtained from the 2-D plot of all operating conditions is found to be 96.87% without correction and 99.31% with spatial majority voting (SMV). Ministry of Education (MOE) Accepted version This work was supported by Kongque Technology Innovation Foundation of Shenzhen (KQJSCX20170727101037551), Fundamental Research Foundation of Shenzhen (JCYJ20190808151819049), Singapore Ministry of Education Tier 1 grant MOE2018-T1-001-131 (RG87/18), and Natural Science Founda- tion of Jiangsu Province (BK20191160). 2021-01-11T05:21:28Z 2021-01-11T05:21:28Z 2020 Journal Article Zhao, Q., Wu, Y., Zhao, X., Cao, Y., & Chang, C.-H. (2020). A 1036-F2/bit high reliability temperature compensated cross-coupled comparator-based PUF. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 28(6), 1449-1460. doi:10.1109/TVLSI.2020.2980306 1557-9999 https://hdl.handle.net/10356/145827 10.1109/TVLSI.2020.2980306 6 28 1449 1460 en MOE2018-T1-001-131, RG87/18-(S) IEEE Transactions on Very Large Scale Integration (VLSI) Systems © 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: https://doi.org/10.1109/TVLSI.2020.2980306 application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic Engineering::Electrical and electronic engineering
Physical Unclonable Function
Cross-coupled Comparator
spellingShingle Engineering::Electrical and electronic engineering
Physical Unclonable Function
Cross-coupled Comparator
Zhao, Qiang
Wu, Yiheng
Zhao, Xiaojin
Cao, Yuan
Chang, Chip-Hong
A 1036-F2/bit high reliability temperature compensated cross-coupled comparator-based PUF
description In this article, a compact physical unclonable function (PUF) based on cross-coupled comparator is presented. Featuring a positive feedback response generation mechanism, the mismatch in analog signals between the cross-coupled transistor pair is quickly amplified to prevent its polarity from flipping by the temporal noise. The rapid enlargement of noise margin by the sense amplifier also contributes to stabilizing the response against supply voltage variations. To improve its temperature stability, the counteracting effect of complementary-to-absolute temperature (CTAT) and proportional-to-absolute-temperature (PTAT) drives are considered in sizing the bit cell transistors. The proposed design is fabricated in a standard 65-nm CMOS process. The bit cell occupies an area of only 4.38 µm2 (i.e., 1036 F2), and the overall PUF chip consumes 2.98 pJ/bit at the throughput of 8 Mb/s, of which only 1.61 pJ/bit is due to the PUF’s core. With the uniqueness measured to be 49.53%, the unpredictability of the fabricated PUF chips is validated by autocorrelation function and NIST randomness tests. Compared with the state-of-the-art implementations, the proposed PUF has the lowest native response instability of 1.46% with 500 repeated PUF readouts at 27 ◦C and 1.2 V. By varying the operating temperature from −50 ◦C to 150 ◦C in a step size of 10 ◦C and the supply voltage from 1.0 to 1.4 V in a step size of 0.1 V simultaneously, the average reliability of the proposed PUF obtained from the 2-D plot of all operating conditions is found to be 96.87% without correction and 99.31% with spatial majority voting (SMV).
author2 School of Electrical and Electronic Engineering
author_facet School of Electrical and Electronic Engineering
Zhao, Qiang
Wu, Yiheng
Zhao, Xiaojin
Cao, Yuan
Chang, Chip-Hong
format Article
author Zhao, Qiang
Wu, Yiheng
Zhao, Xiaojin
Cao, Yuan
Chang, Chip-Hong
author_sort Zhao, Qiang
title A 1036-F2/bit high reliability temperature compensated cross-coupled comparator-based PUF
title_short A 1036-F2/bit high reliability temperature compensated cross-coupled comparator-based PUF
title_full A 1036-F2/bit high reliability temperature compensated cross-coupled comparator-based PUF
title_fullStr A 1036-F2/bit high reliability temperature compensated cross-coupled comparator-based PUF
title_full_unstemmed A 1036-F2/bit high reliability temperature compensated cross-coupled comparator-based PUF
title_sort 1036-f2/bit high reliability temperature compensated cross-coupled comparator-based puf
publishDate 2021
url https://hdl.handle.net/10356/145827
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