The prevalence of lower eyelid epiblepharon and its association with refractive errors in Chinese preschool children : a cross-sectional study

• Main Authors: Zhuo, Deyi, Chen, Si, Ren, Xiaofang, Wang, Bingsong, Liu, Linbo, Xiao, Lin
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2021
• Subjects: Engineering::Electrical and electronic engineering; Lower Eyelid Epiblepharon; Astigmatism
• Online Access: https://hdl.handle.net/10356/146223
• Institution: Nanyang Technological University

Background: To assess the prevalence and demographics of lower eyelid epiblepharon in Chinese preschool children and to evaluate its association with refractive errors. Methods: In this population-based, cross-sectional study, a total of 3170 children aged 3 to 6 years from Beijing, China underwent...