Non-profiled side-channel attack based on deep learning using picture trace

• Main Authors: Won, Yoo-Seung, Han, Dong-Guk, Jap, Dirmanto, Bhasin, Shivam, Park, Jong-Yeon
• Format: Article
• Language: English
• Published: 2021
• Subjects: Engineering::Computer science and engineering::Information systems::Information systems applications; Deep Learning; Binarized Neural Network
• Online Access: https://hdl.handle.net/10356/147153
• Institution: Nanyang Technological University

Over the years, deep learning algorithms have advanced a lot and any innovation in the algorithms are demonstrated and benchmarked for image classification. Several other field including side-channel analysis (SCA) have recently adopted deep learning with great success. In SCA, the deep learning alg...