Thermal conductivity measurement of nanostructures
This experiment presents to you the extraction of thermal properties of single wall carbon nanotube bundles from our 3 layered samples using the Pulsed Photothermal Reflectance technique. The top layer of the sample is a gold film, the second layer is silicon dioxide or CNT array and the bottom laye...
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| التنسيق: | Final Year Project |
| اللغة: | English |
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2009
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| الوصول للمادة أونلاين: | http://hdl.handle.net/10356/14742 |
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| المؤسسة: | Nanyang Technological University |
| اللغة: | English |
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sg-ntu-dr.10356-147422023-07-07T17:48:33Z Thermal conductivity measurement of nanostructures Lim, Yuwei. George Chung Kit Chen School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Nanoelectronics This experiment presents to you the extraction of thermal properties of single wall carbon nanotube bundles from our 3 layered samples using the Pulsed Photothermal Reflectance technique. The top layer of the sample is a gold film, the second layer is silicon dioxide or CNT array and the bottom layer being the silicon substrate. Two silicon dioxide samples of different thickness will be used to verify the accuracy of our setup and three CNT samples of different thickness will be measured and investigated. For modeling, we utilized the transmission-line theory for curve fitting. The mean value of the thermal conductivity of our CNT samples were 0.65 W/mK for 2 um CNT thickness, 1.06 W/mK for 4 um and 1.12 W/mK for 5 um. Bachelor of Engineering 2009-01-30T07:51:08Z 2009-01-30T07:51:08Z 2008 2008 Final Year Project (FYP) http://hdl.handle.net/10356/14742 en 69 p. application/pdf |
| institution |
Nanyang Technological University |
| building |
NTU Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NTU Library |
| collection |
DR-NTU |
| language |
English |
| topic |
DRNTU::Engineering::Electrical and electronic engineering::Nanoelectronics |
| spellingShingle |
DRNTU::Engineering::Electrical and electronic engineering::Nanoelectronics Lim, Yuwei. Thermal conductivity measurement of nanostructures |
| description |
This experiment presents to you the extraction of thermal properties of single wall carbon nanotube bundles from our 3 layered samples using the Pulsed Photothermal Reflectance technique. The top layer of the sample is a gold film, the second layer is silicon dioxide or CNT array and the bottom layer being the silicon substrate. Two silicon dioxide samples of different thickness will be used to verify the accuracy of our setup and three CNT samples of different thickness will be measured and investigated. For modeling, we utilized the transmission-line theory for curve fitting. The mean value of the thermal conductivity of our CNT samples were 0.65 W/mK for 2 um CNT thickness, 1.06 W/mK for 4 um and 1.12 W/mK for 5 um. |
| author2 |
George Chung Kit Chen |
| author_facet |
George Chung Kit Chen Lim, Yuwei. |
| format |
Final Year Project |
| author |
Lim, Yuwei. |
| author_sort |
Lim, Yuwei. |
| title |
Thermal conductivity measurement of nanostructures |
| title_short |
Thermal conductivity measurement of nanostructures |
| title_full |
Thermal conductivity measurement of nanostructures |
| title_fullStr |
Thermal conductivity measurement of nanostructures |
| title_full_unstemmed |
Thermal conductivity measurement of nanostructures |
| title_sort |
thermal conductivity measurement of nanostructures |
| publishDate |
2009 |
| url |
http://hdl.handle.net/10356/14742 |
| _version_ |
1772827343843229696 |