Nanometer-scale precipitations in a selective electron beam melted nickel-based superalloy

The nanometer-scale (nano-scale) microstructural evolution in an additively manufactured Re-free Ni-based superalloy, with single crystal compositions, is investigated through field emission scanning electron microscopy, transmission electron microscopy, and atom probe tomography. We find that nano-...

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Main Authors: Chandra, Shubham, Tan, Xipeng, Narayan, R. Lakshmi, Descoins, Marion, Mangelinck, Dominique, Tor, Shu Beng, Liu, Erjia, Seet, Gerald
其他作者: School of Mechanical and Aerospace Engineering
格式: Article
語言:English
出版: 2021
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在線閱讀:https://hdl.handle.net/10356/148264
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