Double resonance Raman scattering in single-layer MoSe₂ under moderate pressure

Pressure-dependent properties in layered transition-dichalcogenides are important for our understanding of their basic structures and applications. We investigate the electronic structure in MoSe₂ monolayer under external pressure up to 5.73GPa by Raman spectroscopy and photoluminescence (PL) spectr...

وصف كامل

محفوظ في:
التفاصيل البيبلوغرافية
المؤلفون الرئيسيون: Li, Jian-mei, Yao, Yi-kun, Sun, Li-huan, Shan, Xin-yan, Wang, Cong, Lu, Xing-hua
مؤلفون آخرون: School of Physical and Mathematical Sciences
التنسيق: مقال
اللغة:English
منشور في: 2021
الموضوعات:
الوصول للمادة أونلاين:https://hdl.handle.net/10356/151667
الوسوم: إضافة وسم
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المؤسسة: Nanyang Technological University
اللغة: English
الوصف
الملخص:Pressure-dependent properties in layered transition-dichalcogenides are important for our understanding of their basic structures and applications. We investigate the electronic structure in MoSe₂ monolayer under external pressure up to 5.73GPa by Raman spectroscopy and photoluminescence (PL) spectroscopy. The double resonance out-of-plane acoustic mode (2ZA) phonon is observed in Raman spectroscopy near 250 cm ⁻¹ , which presents pronounced intensity and pressure dependence. Significant variation in 2ZA peak intensity under different pressures reflects the change in electronic band structure as pressure varies, which is consistent with the blue shift in PL spectroscopy. The high sensitivity in both Raman and PL spectroscopy under moderate pressure in such a two-dimensional material may have many advantages for optoelectronic applications.