Investigation of electrical noise signal triggered resistive switching and its implications

• Main Authors: Sun, Jianxun, Tan, Juan Boon, Chen, Tupei
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2021
• Subjects: Engineering::Electrical and electronic engineering; Bipolar Pulse; Electrical Noise
• Online Access: https://hdl.handle.net/10356/154466
• Institution: Nanyang Technological University

In this article, the electrical noise signal triggered switching of resistive random access memory (RRAM) device is investigated. As noise is also generated when powering up the light source, such a phenomenon can be easily mistaken as a light-activated event. Thus, it is necessary to conduct a ...