Investigation of electrical noise signal triggered resistive switching and its implications

• المؤلفون الرئيسيون: Sun, Jianxun, Tan, Juan Boon, Chen, Tupei
• مؤلفون آخرون: School of Electrical and Electronic Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2021
• الموضوعات: Engineering::Electrical and electronic engineering; Bipolar Pulse; Electrical Noise
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/154466

In this article, the electrical noise signal triggered switching of resistive random access memory (RRAM) device is investigated. As noise is also generated when powering up the light source, such a phenomenon can be easily mistaken as a light-activated event. Thus, it is necessary to conduct a ...