Comparing data driven and physics inspired models for hopping transport in organic field effect transistors

The past few decades have seen an uptick in the scope and range of device applications of organic semiconductors, such as organic field-effect transistors, organic photovoltaics and light-emitting diodes. Several researchers have studied electrical transport in these materials and proposed physical...

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Main Authors: Lakshminarayanan, Madhavkrishnan, Dutta, Rajdeep, Repaka, D. V. Maheswar, Jayavelu, Senthilnath, Leong, Wei Lin, Hippalgaonkar, Kedar
Other Authors: School of Materials Science and Engineering
Format: Article
Language:English
Published: 2022
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Online Access:https://hdl.handle.net/10356/154934
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Institution: Nanyang Technological University
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spelling sg-ntu-dr.10356-1549342022-01-24T05:11:58Z Comparing data driven and physics inspired models for hopping transport in organic field effect transistors Lakshminarayanan, Madhavkrishnan Dutta, Rajdeep Repaka, D. V. Maheswar Jayavelu, Senthilnath Leong, Wei Lin Hippalgaonkar, Kedar School of Materials Science and Engineering School of Electrical and Electronic Engineering Institute of Materials Research and Engineering, A*STAR Engineering::Mechanical engineering Computational Science Materials for Devices Organic Molecules in Materials Science Scaling Laws Scientific Data Theory and Computation The past few decades have seen an uptick in the scope and range of device applications of organic semiconductors, such as organic field-effect transistors, organic photovoltaics and light-emitting diodes. Several researchers have studied electrical transport in these materials and proposed physical models to describe charge transport with different material parameters, with most disordered semiconductors exhibiting hopping transport. However, there exists a lack of a consensus among the different models to describe hopping transport accurately and uniformly. In this work, we first evaluate the efficacy of using a purely data-driven approach, i.e., symbolic regression, in unravelling the relationship between the measured field-effect mobility and the controllable inputs of temperature and gate voltage. While the regressor is able to capture the scaled mobility well with mean absolute error (MAE) ~ O(10–2), better than the traditionally used hopping transport model, it is unable to derive physically interpretable input–output relationships. We then examine a physics-inspired renormalization approach to describe the scaled mobility with respect to a scale-invariant reference temperature. We observe that the renormalization approach offers more generality and interpretability with a MAE of the ~ O(10–1), still better than the traditionally used hopping model, but less accurate as compared to the symbolic regression approach. Our work shows that physics-based approaches are powerful compared to purely data-driven modelling, providing an intuitive understanding of data with extrapolative ability. Agency for Science, Technology and Research (A*STAR) Ministry of Education (MOE) Published version R.D., S.J. and K.H. acknowledge funding from the Accelerated Materials Development for Manufacturing Program at A*STAR via the AME Programmatic Fund by the Agency for Science, Technology and Research under Grant No. A1898b0043. W.L.L. would like to acknowledge funding support from Ministry of Education (MOE) under AcRF Tier 2 Grant (2019-T2-2-106). 2022-01-24T02:48:31Z 2022-01-24T02:48:31Z 2021 Journal Article Lakshminarayanan, M., Dutta, R., Repaka, D. V. M., Jayavelu, S., Leong, W. L. & Hippalgaonkar, K. (2021). Comparing data driven and physics inspired models for hopping transport in organic field effect transistors. Scientific Reports, 11, 23621-. https://dx.doi.org/10.1038/s41598-021-02737-7 2045-2322 https://hdl.handle.net/10356/154934 10.1038/s41598-021-02737-7 11 23621 en A1898b0043 2019-T2-2-106 Scientific Reports © 2021 The Author(s). This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. Te images or other third party material in this article are included in the article’s Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic Engineering::Mechanical engineering
Computational Science
Materials for Devices
Organic Molecules in Materials Science
Scaling Laws
Scientific Data
Theory and Computation
spellingShingle Engineering::Mechanical engineering
Computational Science
Materials for Devices
Organic Molecules in Materials Science
Scaling Laws
Scientific Data
Theory and Computation
Lakshminarayanan, Madhavkrishnan
Dutta, Rajdeep
Repaka, D. V. Maheswar
Jayavelu, Senthilnath
Leong, Wei Lin
Hippalgaonkar, Kedar
Comparing data driven and physics inspired models for hopping transport in organic field effect transistors
description The past few decades have seen an uptick in the scope and range of device applications of organic semiconductors, such as organic field-effect transistors, organic photovoltaics and light-emitting diodes. Several researchers have studied electrical transport in these materials and proposed physical models to describe charge transport with different material parameters, with most disordered semiconductors exhibiting hopping transport. However, there exists a lack of a consensus among the different models to describe hopping transport accurately and uniformly. In this work, we first evaluate the efficacy of using a purely data-driven approach, i.e., symbolic regression, in unravelling the relationship between the measured field-effect mobility and the controllable inputs of temperature and gate voltage. While the regressor is able to capture the scaled mobility well with mean absolute error (MAE) ~ O(10–2), better than the traditionally used hopping transport model, it is unable to derive physically interpretable input–output relationships. We then examine a physics-inspired renormalization approach to describe the scaled mobility with respect to a scale-invariant reference temperature. We observe that the renormalization approach offers more generality and interpretability with a MAE of the ~ O(10–1), still better than the traditionally used hopping model, but less accurate as compared to the symbolic regression approach. Our work shows that physics-based approaches are powerful compared to purely data-driven modelling, providing an intuitive understanding of data with extrapolative ability.
author2 School of Materials Science and Engineering
author_facet School of Materials Science and Engineering
Lakshminarayanan, Madhavkrishnan
Dutta, Rajdeep
Repaka, D. V. Maheswar
Jayavelu, Senthilnath
Leong, Wei Lin
Hippalgaonkar, Kedar
format Article
author Lakshminarayanan, Madhavkrishnan
Dutta, Rajdeep
Repaka, D. V. Maheswar
Jayavelu, Senthilnath
Leong, Wei Lin
Hippalgaonkar, Kedar
author_sort Lakshminarayanan, Madhavkrishnan
title Comparing data driven and physics inspired models for hopping transport in organic field effect transistors
title_short Comparing data driven and physics inspired models for hopping transport in organic field effect transistors
title_full Comparing data driven and physics inspired models for hopping transport in organic field effect transistors
title_fullStr Comparing data driven and physics inspired models for hopping transport in organic field effect transistors
title_full_unstemmed Comparing data driven and physics inspired models for hopping transport in organic field effect transistors
title_sort comparing data driven and physics inspired models for hopping transport in organic field effect transistors
publishDate 2022
url https://hdl.handle.net/10356/154934
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