A data-driven method for IGBT open-circuit fault diagnosis based on hybrid ensemble learning and sliding-window classification

• Main Authors: Xia, Yang, Xu, Yan, Gou, Bin
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2022
• Subjects: Engineering::Electrical and electronic engineering; Hybrid Ensemble Learning; Multiobjective Optimization Programming
• Online Access: https://hdl.handle.net/10356/155302
• Institution: Nanyang Technological University

In this article, a novel data-driven method is proposed for open-circuit fault diagnosis of insulated gate bipolar transistor used in three-phase pulsewidth modulation converter. Based on the sampled three-phase current signals, fast Fourier transform and ReliefF algorithm are used to select most co...