Revolutionizing X-ray technology through the power of computer algorithms
X-ray technology has become an integral part of modern-day society, having applications across multiple industries. However, manipulation of X-rays has always been difficult due to their high penetration properties. Reflection of X-ray only occurs at minute angles and the percentage reflected is not...
Saved in:
Main Author: | |
---|---|
Other Authors: | |
Format: | Final Year Project |
Language: | English |
Published: |
Nanyang Technological University
2022
|
Subjects: | |
Online Access: | https://hdl.handle.net/10356/157930 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Language: | English |
id |
sg-ntu-dr.10356-157930 |
---|---|
record_format |
dspace |
spelling |
sg-ntu-dr.10356-1579302023-07-07T19:20:36Z Revolutionizing X-ray technology through the power of computer algorithms Lee, Ren Hao Wong Liang Jie School of Electrical and Electronic Engineering liangjie.wong@ntu.edu.sg Engineering::Electrical and electronic engineering X-ray technology has become an integral part of modern-day society, having applications across multiple industries. However, manipulation of X-rays has always been difficult due to their high penetration properties. Reflection of X-ray only occurs at minute angles and the percentage reflected is not significant enough for many applications. In this paper, methods to enhance the performance of X-rays are investigated. The use of multilayer materials such as superlattices improves reflectivity by making use of alternating materials to create multiple reflections within the structure itself. The overall reflectivity is obtained from the sum of these individual reflections. The resultant reflectivity is thereby much higher compared to using a single material, as a portion of the transmitted X-rays is reflected. In addition, computational techniques were applied to identify the best combination of parameters to obtain optimal reflectivity. Three different multilayer structures were chosen, each representing a particular region in the X-ray spectrum. Graphical analysis was first conducted to identify the impact of different parameters on the overall reflectivity of the structure. Using the analysis results obtained, a heuristic search algorithm such as Genetic Algorithm was applied to optimize the peak and mean reflectivity of the three chosen structures separately. Bachelor of Engineering (Electrical and Electronic Engineering) 2022-05-25T03:26:36Z 2022-05-25T03:26:36Z 2022 Final Year Project (FYP) Lee, R. H. (2022). Revolutionizing X-ray technology through the power of computer algorithms. Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/157930 https://hdl.handle.net/10356/157930 en A2261-211 application/pdf Nanyang Technological University |
institution |
Nanyang Technological University |
building |
NTU Library |
continent |
Asia |
country |
Singapore Singapore |
content_provider |
NTU Library |
collection |
DR-NTU |
language |
English |
topic |
Engineering::Electrical and electronic engineering |
spellingShingle |
Engineering::Electrical and electronic engineering Lee, Ren Hao Revolutionizing X-ray technology through the power of computer algorithms |
description |
X-ray technology has become an integral part of modern-day society, having applications across multiple industries. However, manipulation of X-rays has always been difficult due to their high penetration properties. Reflection of X-ray only occurs at minute angles and the percentage reflected is not significant enough for many applications.
In this paper, methods to enhance the performance of X-rays are investigated. The use of multilayer materials such as superlattices improves reflectivity by making use of alternating materials to create multiple reflections within the structure itself. The overall reflectivity is obtained from the sum of these individual reflections. The resultant reflectivity is thereby much higher compared to using a single material, as a portion of the transmitted X-rays is reflected.
In addition, computational techniques were applied to identify the best combination of parameters to obtain optimal reflectivity. Three different multilayer structures were chosen, each representing a particular region in the X-ray spectrum. Graphical analysis was first conducted to identify the impact of different parameters on the overall reflectivity of the structure. Using the analysis results obtained, a heuristic search algorithm such as Genetic Algorithm was applied to optimize the peak and mean reflectivity of the three chosen structures separately. |
author2 |
Wong Liang Jie |
author_facet |
Wong Liang Jie Lee, Ren Hao |
format |
Final Year Project |
author |
Lee, Ren Hao |
author_sort |
Lee, Ren Hao |
title |
Revolutionizing X-ray technology through the power of computer algorithms |
title_short |
Revolutionizing X-ray technology through the power of computer algorithms |
title_full |
Revolutionizing X-ray technology through the power of computer algorithms |
title_fullStr |
Revolutionizing X-ray technology through the power of computer algorithms |
title_full_unstemmed |
Revolutionizing X-ray technology through the power of computer algorithms |
title_sort |
revolutionizing x-ray technology through the power of computer algorithms |
publisher |
Nanyang Technological University |
publishDate |
2022 |
url |
https://hdl.handle.net/10356/157930 |
_version_ |
1772825709563084800 |