Deep learning algorithm for tree defect detection

• Main Author: Leow, Yi En
• Other Authors: Abdulkadir C. Yucel
• Format: Final Year Project
• Language: English
• Published: Nanyang Technological University 2022
• Subjects: Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/158116
• Institution: Nanyang Technological University

This paper contains the final report for the final year project titled ‘Deep Learning Algorithm for Tree Defect Detection’, project number B3005-211. The arborist in Singapore uses visual as the first level of inspection; however, trees may look strong and durable on the outside but full of cavities...