Deep anomaly detection for time-series data in industrial IoT: a communication-efficient on-device federated learning approach

Since edge device failures (i.e., anomalies) seriously affect the production of industrial products in Industrial IoT (IIoT), accurately and timely detecting anomalies is becoming increasingly important. Furthermore, data collected by the edge device may contain the user's private data, whic...

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Bibliographic Details
Main Authors: Liu, Yi, Garg, Sahil, Nie, Jiangtian, Zhang, Yang, Xiong, Zehui, Kang, Jiawen, Hossain, M. Shamim
Other Authors: School of Computer Science and Engineering
Format: Article
Language:English
Published: 2022
Subjects:
Online Access:https://hdl.handle.net/10356/159853
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Institution: Nanyang Technological University
Language: English