Impedance-oriented transient instability modeling of SiC MOSFET intruded by measurement probes

• Main Authors: Zeng, Zheng, Zhang, Xin, Blaabjerg, Frede, Miao, Linjing
• 其他作者: School of Electrical and Electronic Engineering
• 格式: Article
• 語言: English
• 出版: 2022
• 主題: Engineering::Electrical and electronic engineering; Impedance Modeling; Measurement Probes
• 在線閱讀: https://hdl.handle.net/10356/160919

Due to the breakneck switching speed, SiC mosfet is extremely sensitive to parasitics in the power device, circuit layout, and also measurement probe. It is not clear how the parasitics of measurement probes affect the transient stability of SiC mosfet, and it poses an unsolved challenge for the ind...