Crack problems in thin-layered structures
Thin-layered structures are used in a variety of applications today. Prevention of failure of these structures is important by identify the integrity or strength of these structures. The thickness of the crack residing layer, the distance from crack to the layers interface and elastic modulus mismat...
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Main Author: | Lai, Alvin Junqi |
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Other Authors: | Xiao Zhongmin |
Format: | Final Year Project |
Language: | English |
Published: |
2009
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Subjects: | |
Online Access: | http://hdl.handle.net/10356/16166 |
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Institution: | Nanyang Technological University |
Language: | English |
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