A novel fault diagnosis method of smart grids based on memory spiking neural P systems considering measurement tampering attacks

• Main Authors: Wang, Tao, Liu, Wei, Cabrera, Luis Valencia, Wang, Peng, Wei, Xiaoguang, Zang, Tianlei
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2022
• Subjects: Engineering::Electrical and electronic engineering; Fault Diagnosis; Membrane Computing
• Online Access: https://hdl.handle.net/10356/163876
• Institution: Nanyang Technological University

Cyber-attacks can tamper with measurement data from physical systems via communication networks of smart grids, which could potentially lead circuit breakers to trip creating a false fault in the absence of any faulty section. Accordingly, a fault diagnosis method should first determine whether a fa...