Lee, Y. X., & Jianmin, Z. (2023). Machine learning based image analysis for surface defect inspection. Nanyang Technological University.
استشهاد بنمط شيكاغوLee, Yong Xian, و Zheng Jianmin. Machine Learning Based Image Analysis for Surface Defect Inspection. Nanyang Technological University, 2023.
MLA استشهادLee, Yong Xian, و Zheng Jianmin. Machine Learning Based Image Analysis for Surface Defect Inspection. Nanyang Technological University, 2023.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.