Machine learning based image analysis for surface defect inspection

• 主要作者: Lee, Yong Xian
• 其他作者: Zheng Jianmin
• 格式: Final Year Project
• 語言: English
• 出版: Nanyang Technological University 2023
• 主題: Engineering::Computer science and engineering::Computing methodologies::Image processing and computer vision; Engineering::Computer science and engineering::Computing methodologies::Pattern recognition
• 在線閱讀: https://hdl.handle.net/10356/165900
• 機構: Nanyang Technological University

The progress in computer vision technology has significantly improved the reliability, effectiveness, and efficiency of defect detection. This is attributed to the availability of advanced optical illumination systems and appropriate image capturing devices that produce high-quality images. Addition...