Machine learning based image analysis for surface defect inspection
The progress in computer vision technology has significantly improved the reliability, effectiveness, and efficiency of defect detection. This is attributed to the availability of advanced optical illumination systems and appropriate image capturing devices that produce high-quality images. Addition...
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| Format: | Final Year Project |
| Language: | English |
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Nanyang Technological University
2023
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| Online Access: | https://hdl.handle.net/10356/165900 |
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| Institution: | Nanyang Technological University |
| Language: | English |