Machine learning based image analysis for surface defect inspection

• المؤلف الرئيسي: Lee, Yong Xian
• مؤلفون آخرون: Zheng Jianmin
• التنسيق: Final Year Project
• اللغة: English
• منشور في: Nanyang Technological University 2023
• الموضوعات: Engineering::Computer science and engineering::Computing methodologies::Image processing and computer vision; Engineering::Computer science and engineering::Computing methodologies::Pattern recognition
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/165900

The progress in computer vision technology has significantly improved the reliability, effectiveness, and efficiency of defect detection. This is attributed to the availability of advanced optical illumination systems and appropriate image capturing devices that produce high-quality images. Addition...