Electromagnetic shielding test system for planar materials

• Main Author: Chang, Eleena Xuan Ling
• Other Authors: See Kye Yak
• Format: Final Year Project
• Language: English
• Published: Nanyang Technological University 2023
• Subjects: Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/167697
• Institution: Nanyang Technological University

This report describes the Final Year Project (FYP) that has been assigned to me during my final year of studies in the School of Electrical and Electronic Engineering (EEE), under the three-year degree of EEE. Undesirable noise or interference caused by external sources which disrupts the normal functionality of electronic devices and systems are known as Electromagnetic Interference (EMI). Presently, due to the disruption caused by EMI onto electronic systems and equipment, it causes the need for the implementation of EMI Shielding which helps to protect signals from external EMI disruption, as well as to prevent interference of surrounding components that could possibly affect the generation of signals [1]. Different fields such as medical, military utilizes common systems that has EMI Shielding protecting them, which potentially protects such systems from EMI disruptions [2]. This current FYP Project focuses on testing two newly fabricated test jigs, CSH2 and CSH3, which are used for testing the EMI Shielding Effectiveness of various planar materials such as copper, steel, aluminium, stainless steel, and many more. The planar materials which we will be using for testing are different types of CFRP materials.