Revolutionizing X-ray technology through the power of computer algorithm

• Main Author: Anil, Arya
• Other Authors: Wong Liang Jie
• Format: Final Year Project
• Language: English
• Published: Nanyang Technological University 2023
• Subjects: Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/167927
• Institution: Nanyang Technological University

This study proposes an X-ray mirror of high reflectivity with multilayer structure based on X-ray reflectivity data measured. Today, a vast range of applications, including medicine, biomedical research, microscopy, airport security, quality control, and manufacturing, among others, all depend on X-ray technology. The reflectivity of X-rays is not the same way as photons. Different type of superlattices materials is simulated to achieve high reflectivity. Si -SiO2 and Si -GaAs are the two sets of multiple layers are tested within the Hard X-rays and Soft X-rays wavelength range. X-ray Reflectivity method helps to analyse the effect of different properties of a layer on reflectivity. Transfer Matrix method is simulated in MATLAB App designer using the materials to calculate the reflectance of a multilayer. This algorithm helps to design mirrors based on the different layers’ parameters obtained in the simulation.